​Sample Preparation
Structural Characterization Lab
​Magnetic Characterization Lab
​Vibration Energy Harvesting Setup
​Tyndall Central Facility
​Clean Room Facility
Scanning Electron Microscope
Model- Zeiss Supra-40
  • GEMINI® FESEM column capable of 1 nm resolution.
  • Raith Quantum™ high-speed beam blanker and software for precision electron beam lithography up to 30 kV.
  • Bruker XFlash® 6|30 EDX and e-FlashHR EBSD detectors, for materials and elemental analysis
  • The AML boasts a class 10000 cleanroom with fume hoods, wet bench, and spinners for resist based lithography.
X-Ray Diffractometer
Model- PANanalytical X'Pert Pro MRD
  • HR-XRD (symmetric and asymmetric rocking curve and coupled-scan measurements) for thin films.
  • ​Reciprocal space mapping.
  • Reflectivity measurements.
  • ​Epitaxy software for advanced modeling of layered structures.
  • Coupled 2θ​-⍵ scans for phase analysis for powder diffraction
Transmission Electron Microscope
Model-Jeol 2100 High-Resolution TEM
  • Multipurpose 200 kV TEM with simple and ease-of-use operability and excellent expandability
  • Excellent LaB6 electron gun promises excellent performance with a reasonable cost.
  • Ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration)　enables us to perform an observation at atomic resolution.
  • STEM (Scanning Transmission Electron Microscope: option) function integrated in PC control system enables us to see a scanning image of a sample at nanometer resolution.
  • EDS (Energy Dispersive X-ray Spectrometer) with a 0.28sr of solid angle (in HR configuration with a 50mm2 detector) performs highly sensitive analysis at nanometer resolution.
  • Highly stable specimen stage enables us to perform a long term observation and analysis.