Facilities

SQUID (Superconducting quantum interference device) Magnetometer with variable temperature platform (1.4K-800K)

Model – MPMS XL5
Vendor – Quantum design, USA
Installed – Sept, 2006.
Capabilities:

Hysteresis loop up to 5T applied field at Room temperature as well as up to 1.4K.
Magnetisation Vs temperature from room temperature up to 1.4K.
AC susceptibility from Room temperature to 1.4K with a maximum ac field of 2.5Oe from 0.01Hz to 1.5KHz.
Curie temperature determination up to 800K.
Measurement of small coercivity with ultra low field.
Powder as well as bulk samples (~5 mm wide) can be measured.

Wafer-Level (4” & 6”) Magnetic Hysteresis Loop Tracer

Model – MESA 200 HF
Vendor – SHB Instruments, USA
Installed – Sept, 2006.
Capabilities:

Real time hysteresis loop measurement on blanket Si Wafer (4” & 6”) up to a field of 0.1T
Real time hysteresis loop measurement on patterened Si Wafer (4” & 6”) up to a field of 0.1T
Real time determination of easy and hard anisotropy axis.
Measurement of magnetostriction.
Measurement of anisotropy field.

Ryowa complex permeability spectra

Model – PMM 9G
Vendor – Ryowa Electronics, Japan
Installed – Sept, 2006.
Capabilities:

Complex permeability characterization at Room temperature from 1MHz to 9GHz
Loss spectra up to 9GHz for a sample size 4mm X 0.8mm X 10mm
Transverse bias field measurement from 0 to 0.2T

Magnetic Force Microscopy

Model - Dimension Edge with ScanAsyst
Vendor - Bruker, USA

Specifications:

X-Y Scan - Range: 90 μm x 90 μm typical, 85 μm minimum
Z Range -minimum: 10 μm typical in imaging and force ramp modes, 9.5 μm
Vertical Noise Floor: <50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz)
XY Position Sensor Noise Level (Closed Loop) : <0.5nm RMS typical imaging bandwidth (up to 625Hz)
Z Position Sensor Noise Level (Closed Loop): <0.2nm RMS typical imaging bandwidth (up to 625Hz)
Sample/Size/Holder : 150mm vacuum chuck, 15mm thick; Up to 40mm thick with optional frame spacer
Motorized Positioning Stage (X-Y axis): 150mm x 150mm inspectable area; Programmable for multi-site measurements
Microscope Optics: 5-megapixel digital camera; 180μm to 1465μm viewing area; Digital zoom and motorized focus
Sample Temperature Control: -35°C to +250°C with optional heater/cooler accessory; Includes gas purging capability
XY Position Sensor Noise Level (Closed Loop) : <0.5nm RMS typical imaging bandwidth (up to 625Hz)
Z Position Sensor Noise Level (Closed Loop): <0.2nm RMS typical imaging bandwidth (up to 625Hz)
Sample/Size/Holder : 150mm vacuum chuck, 15mm thick; Up to 40mm thick with optional frame spacer
Motorized Positioning Stage (X-Y axis): 150mm x 150mm inspectable area; Programmable for multi-site measurements
Microscope Optics: 5-megapixel digital camera; 180μm to 1465μm viewing area; Digital zoom and motorized focus
Sample Temperature Control: -35°C to +250°C with optional heater/cooler accessory; Includes gas purging capability

AFM Modes:

Standard

Optional

Contact Mode, Lateral Force Microscopy, TappingMode™, PhaseImaging™, LiftMode, Magnetic Force Microscopy, Electric Force Microscopy, Dark Lift, Force Spectroscopy, Nanoindentation, Nanolithography, Adhesion, ScanAsyst

Scanning Tunneling Microscopy, Conductive AFM, Tunneling AFM, Scanning Capacitance Microscopy, Surface Potential Microscopy, Piezoresponse Microscopy, Force Modulation Microscopy, Liquid Imaging, Thermal Analysis, Electrochemical AFM

Capabilities:

Streamlined Access to Top AFM Performance
Effective Solutions for Advanced Applications